Properties of hydorogenated Al-doped ZnO films by multi-step texture

Authors
Tark, S.J.Kang, M.G.Park, S.Kim, Y.H.Kim, W.M.Kim, D.
Issue Date
2009-05
Citation
Korean Journal of Materials Research, v.19, no.5, pp.259 - 264
Abstract
In this study we investigated the effect of the multi-step texturing process on the electrical and optical properties of hydrogenated Al-doped zinc oxide (HAZO) thin films deposited by rf magnetron sputtering. AZO films on glass were prepared by changing the H2/(Ar+H2) ratio at a low temperature of 150 °C. The prepared HAZO films showed lower resistivity and higher carrier concentration and mobility than those of non-hydrogenated AZO films. After deposition, the surface of the HAZO films was multi-step textured in diluted HCl (0.5%) for the investigation of the change in the optical properties and the surface morphology due to etching. As a result, the HAZO film fabricated under the type III condition showed excellent optical properties with a haze value of 52.3%.
Keywords
Al-doped zinc oxide; Al-doped ZnO; AZO films; Electrical and optical properties; Hydrogenated; Low temperatures; Multi-step; Rf magnetron sputter; rf-Magnetron sputtering; TCO; ZnO : Al; Aluminum; Carrier concentration; Carrier mobility; Electric properties; Film preparation; Hydrogenation; Light transmission; Magnetron sputtering; Magnetrons; Optical films; Oxide films; Semiconducting zinc compounds; Surface morphology; Texturing; Zinc; Zinc oxide; Optical properties; Al-doped zinc oxide; Al-doped ZnO; AZO films; Electrical and optical properties; Hydrogenated; Low temperatures; Multi-step; Rf magnetron sputter; rf-Magnetron sputtering; TCO; ZnO : Al; Aluminum; Carrier concentration; Carrier mobility; Electric properties; Film preparation; Hydrogenation; Light transmission; Magnetron sputtering; Magnetrons; Optical films; Oxide films; Semiconducting zinc compounds; Surface morphology; Texturing; Zinc; Zinc oxide; Optical properties; Hydrogenated; Rf magnetron sputter; Surface textured; TCO; ZnO : Al
ISSN
1225-0562
URI
https://pubs.kist.re.kr/handle/201004/132504
DOI
10.3740/MRSK.2009.19.5.259
Appears in Collections:
KIST Article > 2009
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