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Application of atomic-force-microscope direct patterning to selective positioning of InAs quantum dots on GaAs

Title: Application of atomic-force-microscope direct patterning to selective positioning of InAs quantum dots on GaAs

Authors: 현찬경; S.C. Choi; 송상헌; 황성우; 손맹호; 안도열; 박용주; 김은규

Keywords: atoimic force microscopy; AFM; direct patterning; selective positioning; InAs; quatom dots

Issue Date: 2000-10

Publisher: Applied physics letters

Citation: VOL 77, NO 16, 2607-2609

URI: https://pubs.kist.re.kr/handle/201004/13294

ISSN: 0003-6951

Appears in Collections:: KIST Publication > Article

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