Phase Transition Behavior of Ge-Bi-Te Thin Films from an NaCl to Rhombohedral Structure

Authors
Sun, Chang WooLee, Jeong YongKim, Yong Tae
Issue Date
2008-10
Publisher
IOP PUBLISHING LTD
Citation
JAPANESE JOURNAL OF APPLIED PHYSICS, v.47, no.10, pp.7983 - 7985
Abstract
The crystallization tendency and phase transition behavior of Ge-Bi-Te chalcogenide, thin films were investigated with high-resolution transmission electron microscopy. The experimental results show that metastable NaCl changes occur in the stable rhombohedral structure through an intermediate structure with a monoclinic lattice and, secondly, that the motive force of such a phase transformation is the shearing distortion of the metastable structure along the < 100 > direction.
Keywords
TRANSMISSION ELECTRON-MICROSCOPY; TETRADYMITE-LIKE COMPOUNDS; INTERMETALLIC COMPOUND; CRYSTAL-STRUCTURES; X-RAY; GE2SB2TE5; DIFFRACTION; SYSTEM; CRYSTALLIZATION; TRANSMISSION ELECTRON-MICROSCOPY; TETRADYMITE-LIKE COMPOUNDS; INTERMETALLIC COMPOUND; CRYSTAL-STRUCTURES; X-RAY; GE2SB2TE5; DIFFRACTION; SYSTEM; CRYSTALLIZATION; Ge-Bi-Te; transition mechanism; phase change material; transmission electron microscopy
ISSN
0021-4922
URI
https://pubs.kist.re.kr/handle/201004/133122
DOI
10.1143/JJAP.47.7983
Appears in Collections:
KIST Article > 2008
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