Phase Transition Behavior of Ge-Bi-Te Thin Films from an NaCl to Rhombohedral Structure
- Authors
- Sun, Chang Woo; Lee, Jeong Yong; Kim, Yong Tae
- Issue Date
- 2008-10
- Publisher
- IOP PUBLISHING LTD
- Citation
- JAPANESE JOURNAL OF APPLIED PHYSICS, v.47, no.10, pp.7983 - 7985
- Abstract
- The crystallization tendency and phase transition behavior of Ge-Bi-Te chalcogenide, thin films were investigated with high-resolution transmission electron microscopy. The experimental results show that metastable NaCl changes occur in the stable rhombohedral structure through an intermediate structure with a monoclinic lattice and, secondly, that the motive force of such a phase transformation is the shearing distortion of the metastable structure along the < 100 > direction.
- Keywords
- TRANSMISSION ELECTRON-MICROSCOPY; TETRADYMITE-LIKE COMPOUNDS; INTERMETALLIC COMPOUND; CRYSTAL-STRUCTURES; X-RAY; GE2SB2TE5; DIFFRACTION; SYSTEM; CRYSTALLIZATION; TRANSMISSION ELECTRON-MICROSCOPY; TETRADYMITE-LIKE COMPOUNDS; INTERMETALLIC COMPOUND; CRYSTAL-STRUCTURES; X-RAY; GE2SB2TE5; DIFFRACTION; SYSTEM; CRYSTALLIZATION; Ge-Bi-Te; transition mechanism; phase change material; transmission electron microscopy
- ISSN
- 0021-4922
- URI
- https://pubs.kist.re.kr/handle/201004/133122
- DOI
- 10.1143/JJAP.47.7983
- Appears in Collections:
- KIST Article > 2008
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