In situ transmission electron microscopy study on the crystallization of GeTe binary alloy

Authors
Kim, Eun TaeLee, Jeong YongKim, Yong Tae
Issue Date
2008-05-12
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.92, no.19
Abstract
Microstructural properties of GeTe thin films were investigated by an in situ heating method within a high voltage electron microscope (HVEM). The results confirm that the transformation from an amorphous state to a fcc crystalline state yields a GeTe binary alloy with a ring-shaped amorphous structure. The fcc structured GeTe transforms into a GeTe orthorhombic structure during the experiment. The crystallization behavior of the GeTe orthorhombic structure in the HVEM is quite different from thermal crystallization. Our observation of real-time structural change confirms that the relaxed amorphous structure participates in the crystallization process in the electron beam irradiation condition. (C) 2008 American Institute of Physics.
Keywords
THIN-FILMS; PHASE; TRANSFORMATIONS; MEMORY; THIN-FILMS; PHASE; TRANSFORMATIONS; MEMORY; GeTe; Transmission Electron Microscopy; Crystallization
ISSN
0003-6951
URI
https://pubs.kist.re.kr/handle/201004/133493
DOI
10.1063/1.2919048
Appears in Collections:
KIST Article > 2008
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