In situ transmission electron microscopy study on the crystallization of GeTe binary alloy
- Authors
- Kim, Eun Tae; Lee, Jeong Yong; Kim, Yong Tae
- Issue Date
- 2008-05-12
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.92, no.19
- Abstract
- Microstructural properties of GeTe thin films were investigated by an in situ heating method within a high voltage electron microscope (HVEM). The results confirm that the transformation from an amorphous state to a fcc crystalline state yields a GeTe binary alloy with a ring-shaped amorphous structure. The fcc structured GeTe transforms into a GeTe orthorhombic structure during the experiment. The crystallization behavior of the GeTe orthorhombic structure in the HVEM is quite different from thermal crystallization. Our observation of real-time structural change confirms that the relaxed amorphous structure participates in the crystallization process in the electron beam irradiation condition. (C) 2008 American Institute of Physics.
- Keywords
- THIN-FILMS; PHASE; TRANSFORMATIONS; MEMORY; THIN-FILMS; PHASE; TRANSFORMATIONS; MEMORY; GeTe; Transmission Electron Microscopy; Crystallization
- ISSN
- 0003-6951
- URI
- https://pubs.kist.re.kr/handle/201004/133493
- DOI
- 10.1063/1.2919048
- Appears in Collections:
- KIST Article > 2008
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