Structural and magnetic properties of tetragonal Mn1.19Fe0.81As thin film grown on Si(001)

Abstract

We have successfully grown MnxFe2-xAs (x = 1.19) thin film on Si(001) substrate by molecular beam epitaxy. Reflection high-energy electron diffraction (RHEED) and X-ray diffraction (XRD) studies indicate the rough film surface and c-axis orientation in a tetragonal crystal structure. Mn1.19Fe0.81As film exhibited ferrimagnetic ordering at room temperature, which is supported by magnetization, magnetoresistance and anomalous-Hall-effect measurements.