Magnetic and structural properties of Fe ion-implanted GaN

Authors
Kim, WoochulKang, Hee JaeNoh, Sam KyuSong, JonghanKim, Chul Sung
Issue Date
2007-09
Publisher
ELSEVIER SCIENCE BV
Citation
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.316, no.2, pp.E199 - E202
Abstract
The magnetic and structural properties of Fe ion-implanted GaN was investigated by various measurements. XRD results did not show any peaks associated with second phase formation. The magnetization curve at 5K showed ferromagnetic behavior for 900 degrees C-annealed sample. In zero-field-cooled (ZFC) and field-cooled (FC) magnetization measurements, the irreversibility and a cusp-like behavior of the ZFC curve were observed for 900 degrees C-annealed sample. These behaviors are typically observed in superparamagnetic or spin glass phase. While the temperature dependence magnetization of 800 degrees C-annealed sample showed non-Brillouin-like curve and it is not exhibited ferromagnetic hysteresis at 5K. In XPS measurement, the coexistence of metallic Fe (Fe-0) and Fe-N bond (Fe2+ and Fe3+) for Fe 2p core level spectra is observed in as-implanted sample. But 700-900 degrees C-annealed samples showed only Fe-N bond (Fe2+ and Fe3+) spectra. For Ga 3d core level spectra only Ga-N bonds showed for as implanted with 700-900 degrees C-annealed samples. From XPS results, it could be explained that magnetic property of our films originated from FeN structures. (c) 2007 Elsevier B.V. All rights reserved.
Keywords
THIN-FILMS; SEMICONDUCTORS; FERROMAGNETISM; GROWTH; CO; CR; GE; THIN-FILMS; SEMICONDUCTORS; FERROMAGNETISM; GROWTH; CO; CR; GE; ion implantation; magnetic semiconductor
ISSN
0304-8853
URI
https://pubs.kist.re.kr/handle/201004/134159
DOI
10.1016/j.jmmm.2007.04.025
Appears in Collections:
KIST Article > 2007
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