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Diffraction and application in nanostructure using electron microscopy

Other Titles

전자현미경의 회절원리와 나노구조분석 응용

Authors

안재평; 박종구

Issue Date

2006-08

Publisher

한국고분자학회

Citation

고분자과학과 기술, v.17, no.4, pp.493 - 510

Keywords

TEM; Diffraction; SEM; FIB; CBED; Lorentz microscopy; HRTEM

ISSN

1225-0260

URI

https://pubs.kist.re.kr/handle/201004/135253

Appears in Collections:

KIST Article > 2006

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