Dependence of the microstructural and the optical properties on the GaAs spacer thickness in InAs/GaAs double quantum dots grown by using the Indium-flush procedure

Authors
Jung, I. Y.Park, Y. M.Park, Y. J.Lee, J. I.Kim, T. W.
Issue Date
2006-08
Publisher
SPRINGER
Citation
JOURNAL OF MATERIALS SCIENCE, v.41, no.15, pp.5036 - 5039
Keywords
MU-M; PHOTOLUMINESCENCE; TEMPERATURE; INGAAS; SHAPE; WELL; SIZE; MU-M; PHOTOLUMINESCENCE; TEMPERATURE; INGAAS; SHAPE; WELL; SIZE; quantum dot; compound semiconductor; In-flush; spacer layer; optical properties; structural property
ISSN
0022-2461
URI
https://pubs.kist.re.kr/handle/201004/135303
DOI
10.1007/s10853-006-0133-5
Appears in Collections:
KIST Article > 2006
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