Single-photon counting in the 1550-nm wavelength region for quantum cryptography

Abstract

In this paper, we report the measured performance of an InGaAs avalanche photodiode (APD) Module fabricated for single-photon counting. We measured the dark current noise, the after-pulse noise, and the quantum efficiency of the single- photon detector for different temperatures. We then examined our single-photon source and detection system by measuring the coincident probability. From our measurement, we observed that the after-pulse effect of the APD at temperatures below 105 degrees C caused cascade noise build-up on the succeeding electrical signals.