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dc.contributor.authorHan, YH-
dc.contributor.authorKim, KT-
dc.contributor.authorShin, HJ-
dc.contributor.authorMoon, S-
dc.contributor.authorChoi, IH-
dc.date.accessioned2024-01-21T04:42:18Z-
dc.date.available2024-01-21T04:42:18Z-
dc.date.created2021-09-03-
dc.date.issued2005-06-20-
dc.identifier.issn0003-6951-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/136357-
dc.description.abstractTo produce a highly sensitive uncooled microbolometer, the development of a high-performance thermometric material is essential. In this work, amorphous vanadium-tungsten oxide was developed as a thermometric material at a low temperature of 300 degrees C, and the microbolometer, coupled with the material, was designed and fabricated using surface micromachining technology. The vanadium-tungsten oxide showed good properties for application to the microbolometer, such as a high-temperature coefficient of resistance of over -4.0%/K and good compatibility with the surface micromachining and integrated circuit fabrication process due to its low fabrication temperature. As a result, the uncooled microbolometer could be fabricated with high detectivity over 1.0 x 10(9) cm Hz(1/2)/W at a bias current of 7.5 mu A and a chopper frequency of 10 - 20 Hz. (c) 2005 American Institute of Physics.-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectBOLOMETERS-
dc.subjectSILICON-
dc.subjectFILMS-
dc.titleEnhanced characteristics of an uncooled microbolometer using vanadium-tungsten oxide as a thermometric material-
dc.typeArticle-
dc.identifier.doi10.1063/1.1953872-
dc.description.journalClass1-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.86, no.25-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume86-
dc.citation.number25-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000229858300072-
dc.identifier.scopusid2-s2.0-24344477146-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusBOLOMETERS-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusFILMS-
dc.subject.keywordAuthormicrobolometer-
dc.subject.keywordAuthorTCR-
dc.subject.keywordAuthorvanadium-tungsten oxide-
dc.subject.keywordAuthorDetectivity-
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