Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han, YH | - |
dc.contributor.author | Kim, KT | - |
dc.contributor.author | Shin, HJ | - |
dc.contributor.author | Moon, S | - |
dc.contributor.author | Choi, IH | - |
dc.date.accessioned | 2024-01-21T04:42:18Z | - |
dc.date.available | 2024-01-21T04:42:18Z | - |
dc.date.created | 2021-09-03 | - |
dc.date.issued | 2005-06-20 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/136357 | - |
dc.description.abstract | To produce a highly sensitive uncooled microbolometer, the development of a high-performance thermometric material is essential. In this work, amorphous vanadium-tungsten oxide was developed as a thermometric material at a low temperature of 300 degrees C, and the microbolometer, coupled with the material, was designed and fabricated using surface micromachining technology. The vanadium-tungsten oxide showed good properties for application to the microbolometer, such as a high-temperature coefficient of resistance of over -4.0%/K and good compatibility with the surface micromachining and integrated circuit fabrication process due to its low fabrication temperature. As a result, the uncooled microbolometer could be fabricated with high detectivity over 1.0 x 10(9) cm Hz(1/2)/W at a bias current of 7.5 mu A and a chopper frequency of 10 - 20 Hz. (c) 2005 American Institute of Physics. | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | BOLOMETERS | - |
dc.subject | SILICON | - |
dc.subject | FILMS | - |
dc.title | Enhanced characteristics of an uncooled microbolometer using vanadium-tungsten oxide as a thermometric material | - |
dc.type | Article | - |
dc.identifier.doi | 10.1063/1.1953872 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.86, no.25 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 86 | - |
dc.citation.number | 25 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000229858300072 | - |
dc.identifier.scopusid | 2-s2.0-24344477146 | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | BOLOMETERS | - |
dc.subject.keywordPlus | SILICON | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordAuthor | microbolometer | - |
dc.subject.keywordAuthor | TCR | - |
dc.subject.keywordAuthor | vanadium-tungsten oxide | - |
dc.subject.keywordAuthor | Detectivity | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.