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Nano-scale adhesion and friction on Si wafer with the tip size using AFM

Authors

아르빈드 싱; 윤의성; 오현진; 공호성

Issue Date

2004-06

Citation

KSTLE International Journal, v.5, no.1, pp.1 - 6

Keywords

nano; adhesion; friction; tribology; AFM

ISSN

1229-9189

URI

https://pubs.kist.re.kr/handle/201004/137499

Appears in Collections:

KIST Article > 2004

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