Mn-implanted dilute magnetic semiconductor InP : Mn

Authors
Shon, YLee, WCPark, YSKwon, YHLee, SJChung, KJKim, HSKim, DYFu, DJKang, TWFan, XJPark, YJOh, HT
Issue Date
2004-03-29
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.84, no.13, pp.2310 - 2312
Abstract
Unintentionally doped bulk InP was prepared by the liquid encapsulated Czochralski method and subsequently implanted with various. doses of Mn+.. The properties of Mn+-implanted InP:Mn were investigated by various measurements. The results of energy dispersive x-ray peaks displayed injected concentrations of Mn of 0.8% and 8.8%, respectively. The results of photoluminescence (PL) measurement showed that optical broad transitions related to Mn appeared near 1.089, 1.144, and 1.185 eV in samples with various doses of Mn+. It was confirmed that the photoluminescence peaks near. 1.089, 1.144; and 1.185 eV were Mn-correlated PL bands by the implantation of Mn: Ferromagnetic hysteresis loops measured at 10 K were observed and. the temperature-dependent magnetization showed ferromagnetic behavior around 90 K, which almost agreed with. the theoretical prediction (T-c similar to 70 K). (C) 2004 American Institute of Physics.
Keywords
P-TYPE GAN; EPILAYERS; IONS; P-TYPE GAN; EPILAYERS; IONS; diluted magnetic semiconductor; Mn-implantation; curie temperature; SQUID
ISSN
0003-6951
URI
https://pubs.kist.re.kr/handle/201004/137752
DOI
10.1063/1.1690875
Appears in Collections:
KIST Article > 2004
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