Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yoo, SH | - |
dc.contributor.author | Yoon, KH | - |
dc.contributor.author | Choi, JW | - |
dc.contributor.author | Yoon, SJ | - |
dc.date.accessioned | 2024-01-21T07:31:05Z | - |
dc.date.available | 2024-01-21T07:31:05Z | - |
dc.date.created | 2021-09-01 | - |
dc.date.issued | 2004-03-01 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/137773 | - |
dc.description.abstract | The influence of thermally induced strain on quality factor of MgTiO3 ceramics at microwave frequencies via far-infrared reflectivity spectra and X-ray diffraction was investigated as a function of cooling rate. As the cooling rate increased, the crystallographic strain increased and Q(.)f value decreased, which were confirmed via X-ray diffraction and far-infrared reflectivity spectra. This result was attributed to the thermally induced strain and lattice anharmonicity. | - |
dc.language | English | - |
dc.publisher | INST PURE APPLIED PHYSICS | - |
dc.subject | DIELECTRIC-PROPERTIES | - |
dc.subject | THIN-FILMS | - |
dc.subject | TITANATE | - |
dc.subject | SPECTROSCOPY | - |
dc.subject | SRTIO3 | - |
dc.subject | HZ | - |
dc.title | Far-infrared reflectivity spectra and influence of thermally induced strain on quality factor of MgTiO3 ceramics at microwave frequencies | - |
dc.type | Article | - |
dc.identifier.doi | 10.1143/JJAP.43.L343 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, v.43, no.3A, pp.L343 - L345 | - |
dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | - |
dc.citation.volume | 43 | - |
dc.citation.number | 3A | - |
dc.citation.startPage | L343 | - |
dc.citation.endPage | L345 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000224780700008 | - |
dc.identifier.scopusid | 2-s2.0-2442451706 | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | DIELECTRIC-PROPERTIES | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | TITANATE | - |
dc.subject.keywordPlus | SPECTROSCOPY | - |
dc.subject.keywordPlus | SRTIO3 | - |
dc.subject.keywordPlus | HZ | - |
dc.subject.keywordAuthor | quality factor | - |
dc.subject.keywordAuthor | far infrared reflectivity spectra | - |
dc.subject.keywordAuthor | XRD | - |
dc.subject.keywordAuthor | MgTiO3 | - |
dc.subject.keywordAuthor | thermal strain | - |
dc.subject.keywordAuthor | cooling rate | - |
dc.subject.keywordAuthor | lattice anharmonicity | - |
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