Maximum power CW 2.45-W 1.55-mu m InGaAsP laterally tapered laser diodes

Authors
Heo, DCHan, IKLee, JIJeong, JC
Issue Date
2003-09
Publisher
KOREAN PHYSICAL SOC
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.43, no.3, pp.352 - 356
Abstract
1.55-mum InGaAsP tapered lasers were fabricated using a highly p-doped separate confinement layer and strained compensated multiple quantum wells. A maximum power of CW 2.45 W and a diffraction-limited power of CW I W was obtained at room temperature. A reduction of the non-radiative Auger recombination due to a uniform hole distribution in the strain compensated multiple quantum wells (MQWs) was responsible for the high maximum power of the tapered lasers. A high diffraction-limited power of over CW I W was achieved by using a broadened waveguide.
Keywords
LIGHT-CURRENT CHARACTERISTICS; LINEWIDTH ENHANCEMENT FACTOR; QUANTUM-WELL LASERS; SEMICONDUCTOR-LASERS; MQW LASERS; AMPLIFIERS; PERFORMANCE; WAVELENGTH; LIGHT-CURRENT CHARACTERISTICS; LINEWIDTH ENHANCEMENT FACTOR; QUANTUM-WELL LASERS; SEMICONDUCTOR-LASERS; MQW LASERS; AMPLIFIERS; PERFORMANCE; WAVELENGTH; laser diodes; filamentation; taper laser; diffractioin-limited; InGaAsP/InP
ISSN
0374-4884
URI
https://pubs.kist.re.kr/handle/201004/138249
Appears in Collections:
KIST Article > 2003
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