Structural characterization of various ionomers by time-of-flight secondary ion mass spectrometry

Authors
Lee, YHan, SKwon, MHLim, HKim, YSChun, HKim, JS
Issue Date
2003-01-15
Publisher
ELSEVIER SCIENCE BV
Citation
APPLIED SURFACE SCIENCE, v.203, pp.875 - 879
Abstract
To investigate the wetting properties of the copolymers and ionomeric materials, a series of ionomers were synthesized, i.e., poly(styrene-co-acrylate) ionomers. Copolymers and ionomers were modified by plasma source ion implantation (PSII) and their surfaces were characterized by using contact angle measurement and time-of-flight secondary ion mass spectrometry (TOF-SIMS). PSII-treated ionomers provide more hydrophilic and stable surfaces with aging time than untreated ionomers and treated copolymers. Thus, it was concluded that the presence of ionic groups and the ionic interaction between the ionic groups resulted in very hydrophilic surfaces and the slow hydrophobic recovery. TOF-SIMS was used to analyze the copolymer and ionomer surfaces, in order to obtain the fundamental information on the chemical structure and surface properties. (C) 2002 Elsevier Science B.V. All rights reserved.
Keywords
MORPHOLOGY; MORPHOLOGY; ionomer; copolymer; TOF-SIMS; contact angles
ISSN
0169-4332
URI
https://pubs.kist.re.kr/handle/201004/138908
DOI
10.1016/S0169-4332(02)00838-3
Appears in Collections:
KIST Article > 2003
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE