Structural characterization of various ionomers by time-of-flight secondary ion mass spectrometry
- Authors
- Lee, Y; Han, S; Kwon, MH; Lim, H; Kim, YS; Chun, H; Kim, JS
- Issue Date
- 2003-01-15
- Publisher
- ELSEVIER SCIENCE BV
- Citation
- APPLIED SURFACE SCIENCE, v.203, pp.875 - 879
- Abstract
- To investigate the wetting properties of the copolymers and ionomeric materials, a series of ionomers were synthesized, i.e., poly(styrene-co-acrylate) ionomers. Copolymers and ionomers were modified by plasma source ion implantation (PSII) and their surfaces were characterized by using contact angle measurement and time-of-flight secondary ion mass spectrometry (TOF-SIMS). PSII-treated ionomers provide more hydrophilic and stable surfaces with aging time than untreated ionomers and treated copolymers. Thus, it was concluded that the presence of ionic groups and the ionic interaction between the ionic groups resulted in very hydrophilic surfaces and the slow hydrophobic recovery. TOF-SIMS was used to analyze the copolymer and ionomer surfaces, in order to obtain the fundamental information on the chemical structure and surface properties. (C) 2002 Elsevier Science B.V. All rights reserved.
- Keywords
- MORPHOLOGY; MORPHOLOGY; ionomer; copolymer; TOF-SIMS; contact angles
- ISSN
- 0169-4332
- URI
- https://pubs.kist.re.kr/handle/201004/138908
- DOI
- 10.1016/S0169-4332(02)00838-3
- Appears in Collections:
- KIST Article > 2003
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