Microwave dielectric characteristics of (1-x)(Al1/2Ta1/2)O-2-xTiO(2) ceramics

Authors
Choi, JWYoon, SJKim, HJYoon, KH
Issue Date
2002-06
Publisher
INST PURE APPLIED PHYSICS
Citation
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.41, no.6A, pp.3804 - 3807
Abstract
The microwave and structural characteristics of (1 - x)(Al1/2Ta1/2)O-2-xTiO(2) (0 < x < 0.5) ceramics were investigated. (Al12Ta1/2)O-2 and TiO2 had orthorhombic and tetragonal structure. respectively, As TiO2 concentration increased, (1 - x)(Al1/2Ta1/2)O-2-xTiO(2) transformed to tetragonal structure. Specimens having a tetragonal single phase could he obtained for x greater than or equal to 0.15. As TiO2 concentration increased, the grain size. dielectric constant (epsilon(r)) significantly increased, and the temperature coefficient of resonant frequency (tau(f)) changed from negative to positive value. However. quality factor (Q) increased within limited values. A tau(f) of 0 ppm/degreesC was realized at x = 0.2 and the epsilon(r) and Q.f(0) value for this Composition were 29.4 and 75470 GHz, respectively. The relationship between microstructures and dielectric properties was also investigated.
Keywords
RESONATOR; RESONATOR; microwave dielectric materials; dielectric constant; quality factor; temperature coefficient of resonant frequency; tetragonal structure
ISSN
0021-4922
URI
https://pubs.kist.re.kr/handle/201004/139505
DOI
10.1143/JJAP.41.3804
Appears in Collections:
KIST Article > 2002
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