Ellipsometric study of InAs wetting layer in InAs/GaAs quantum dots at the threshold of quantum dot formation

Authors
Lee, HKim, SMPark, YJKim, EK
Issue Date
2001-09-01
Publisher
AMER INST PHYSICS
Citation
JOURNAL OF APPLIED PHYSICS, v.90, no.5, pp.2290 - 2295
Abstract
Using room temperature spectroscopic ellipsometry, we measured the pseudo-dielectric function of self-assembled InAs/GaAs quantum dots at the onset of quantum-dot nucleation in the spectral range from 0.8 to 6 eV. The nominal In coverage varied from 1 to 2.6 ML. In addition to the quantum-dot-related feature at 1.1 eV, we observed two high energy transitions near 1.34 and 1.38 eV which arose from the InAs wetting layer. These two high energy features merged in 1-ML-thick wetting layer. We fitted the dielectric function of InAs wetting layer in the visible range performing multilayer analysis, and found strong excitonic enhancement and blue shift of the E-1 peak. (C) 2001 American Institute of Physics.
Keywords
DIELECTRIC FUNCTION; SPECTROSCOPIC ELLIPSOMETRY; OPTICAL-PROPERTIES; GAAS; GROWTH; STATES; GASB; ALAS; INSB; GAP; DIELECTRIC FUNCTION; SPECTROSCOPIC ELLIPSOMETRY; OPTICAL-PROPERTIES; GAAS; GROWTH; STATES; GASB; ALAS; INSB; GAP; ellipsometry; InAs wetting layer; InAs/GaAs quantum dots; dielectric function
ISSN
0021-8979
URI
https://pubs.kist.re.kr/handle/201004/140182
DOI
10.1063/1.1391413
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KIST Article > 2001
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