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고분자 표면분석을 위한 비행시간형 이차이온 질량분석(TOF-SIMS) 기술

Authors

이연희

Issue Date

2000-12

Publisher

한국고분자학회

Citation

고분자 과학과 기술 = Polymer science and technology, v.11, no.6, pp.798 - 805

Keywords

TOF-SIMS; polymer; surface

ISSN

1225-0260

URI

https://pubs.kist.re.kr/handle/201004/140859

Appears in Collections:

KIST Article > 2000

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