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Atomic force microscopy of hard materials in the phase imaging mode

Authors

안효석; S.A. Chizhik; A. M. Dubravin

Issue Date

2000-11

Citation

Surface Investigation, v.11, pp.51 - 55

Keywords

AFM (Atomic Force Microscopy); phase contrast image; tapping mode

URI

https://pubs.kist.re.kr/handle/201004/140943

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KIST Article > 2000

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