Magnetic properties and reliabilities of FeXN (X = Ti, Al, Hf, CoHf, CrHf) nanocrystalline thin film head materials

Authors
Kim, KHChoi, HWKim, JKim, SRKim, KYHan, SHKim, HJ
Issue Date
2000-09
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE TRANSACTIONS ON MAGNETICS, v.36, no.5, pp.2656 - 2659
Abstract
A series of FeN and FeXN (X = Ti, Al, Hf, CoHf, CrHf) films were prepared by reactive rf magnetron sputtering, These FeXN films exhibit good soft magnetic properties with low coercivity ( <2 Oe) and high moment (15-20 kG), To investigate the reliability of these films, we performed the thermal stability and electrochemical corrosion test for pure Fe, Permalloy, FeN and FeXN films, As results, the direction of the magnetic anisotropy of FeTiN, FeCoHfN and FeCrHfN is not nearly changed on the de magnetic field of 100 Oe perpendicular to the easy axis at 150<degrees>C, up to 3 hrs, The electrochemical corrosion tests were performed in 0.5 M NaCl electrolyte. Permalloy shows the best corrosion resistance in the films but the addition of Cr to FeHfN films significantly improves the corrosion resistance nearly as good as Permalloy, This improvement results from the formation of a negative oxide layer.
Keywords
CORROSION; CORROSION; corrosion resistance; FeXN; nanocystalline; thermal stability; thin film head materials
ISSN
0018-9464
URI
https://pubs.kist.re.kr/handle/201004/141147
DOI
10.1109/20.908550
Appears in Collections:
KIST Article > 2000
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