Application of electrostatic bonding to field emission display vacuum packaging
- Authors
- Lee, DJ; Lee, NY; Jung, SJ; Kim, KS; Lee, YH; Jang, J; Ju, BK
- Issue Date
- 2000-06
- Publisher
- ELECTROCHEMICAL SOC INC
- Citation
- JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.147, no.6, pp.2385 - 2388
- Abstract
- A tubeless packaging technology for field emission display (FED) devices is developed using indirect glass-to-glass electrostatic bonding with an intermediate amorphous silicon layer at a low temperature of 230 degrees C. The glass-to-glass bonding mechanism is investigated by secondary-ion mass spectroscopy. To evaluate the vacuum sealing capability of a FED panel packaged by this method, the leak characteristics of the vacuum were examined by spinning rotor gauge for 6 months and the electron emission properties of the panel was measured continuously for different amounts of time over a 26 day period. In order to examine the effect of the removal of the exhausting tube on the enhancement of vacuum efficiency, we have calculated a theoretical vacuum level in the panel based on conductance and throughput and compared with experimental values. (C) 2000 The Electrochemical Society. S0013-4651(99)09-091-6. All rights reserved.
- Keywords
- GLASS; GLASS; FED
- ISSN
- 0013-4651
- URI
- https://pubs.kist.re.kr/handle/201004/141367
- DOI
- 10.1149/1.1393541
- Appears in Collections:
- KIST Article > 2000
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