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Carrier lifetimes in dielectric disordered GaAs/AlGaAs multiple quantum well with SiN capping layers.

Authors

김용; 최원준; 이석; 우덕하; 김상국; 김선호; 이정일; 강광남; 추장희; 조규만; S. K. Yu; J. C. Seo; D. Kim

Issue Date

1995-12

Citation

Applied physics letters, v.v. 67, no.no. 23, pp.3438 - 3440

Keywords

life time

URI

https://pubs.kist.re.kr/handle/201004/144904

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KIST Article > Others

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