Effect of SiO2 content in Al2O3 on interfacial bonding strength of aiuminium/Al2O3 composite

Authors
Kim, K.B.Yoon, E.P.
Issue Date
1995-01
Publisher
Maney Publishing
Citation
Materials Science and Technology, v.11, no.7, pp.629 - 632
Abstract
In this study, the interfacial bonding strength between pure aluminium or an aluminium alloy (Al-12Si-uCu-1Mg-2Ni) and Al2O3 containing 0-20 wt-%SiO2 was measured using a B scale Rockwell hardness indenter. The interface was analysed using scanning electron microscopy, Auger electron spectroscop, and X-ray diffraction. The results obtained were as follows. In the pure aluminiumtAl2O3 compostte the interfacial bonding strength was not strongly affected by the SiO2 additions, but the interfacial strength of the aluminium alloy/Al2O3 compostte could be significantly improved by small additions (2-5 wt-%) of SiO2 in the Al2O 3. Magnesium was the only alloying element to segregate at the interface. At the interface of the pure aluminium/Al2O 3-20SiO2 specimen, Al2O3 and silicon were detected, and MgAl2O4 and Al2O 3 were detected in the aluminium alloy/Al2O 3-20SiO2 specimen. The interfacial chemical reaction involving magnesium is believed to be important in increasing the interfacial bonding strength. ? 1995 The Institute of Materials.
Keywords
Alloying elements; Aluminum alloys; Auger electron spectroscopy; Chemical bonds; Diffusion bonding; Magnesium; Scanning electron microscopy; Silicon oxides; X ray diffraction; Auger electron; Indenters; Interfacial bonding strength; Interfacial chemical reactions; Interfacial strength; Pure aluminium; Rockwell hardness; Aluminum; Alloying elements; Aluminum alloys; Auger electron spectroscopy; Chemical bonds; Diffusion bonding; Magnesium; Scanning electron microscopy; Silicon oxides; X ray diffraction; Auger electron; Indenters; Interfacial bonding strength; Interfacial chemical reactions; Interfacial strength; Pure aluminium; Rockwell hardness; Aluminum; metal matrix composite
ISSN
0267-0836
URI
https://pubs.kist.re.kr/handle/201004/145392
DOI
10.1080/17432847.1995.11945555
Appears in Collections:
KIST Article > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE