Vertical bridgman techniques to homogenize zinc composition of CdZnTe substrates

Authors
Lee, T.S.Lee, S.B.Kim, J.M.Kim, J.S.Suh, S.H.Song, J.H.Park, I.H.Kim, S.U.Park, M.J.
Issue Date
1995-01
Publisher
Springer-Verlag
Citation
Journal of Electronic Materials, v.24, no.9, pp.1057 - 1059
Abstract
In order to improve the Zn homogeneity along the axial direction of CdZnTe boule, we have employed a modified Bridgman technique using a (Cd, Zn) alloy source in communication with the melt, whose temperature has been gradually changed from 800 to 840°C during growth. Electron probe microanalysis (EPMA) measurements of Zn composition in the boule shows an excellent homogeneity of Zn along the axis of the CdZnTe boule compared with results in a boule grown by using a fixed source temperature. We have performed a numerical simulation to obtain the approximate temperatures of additional heating and cooling needed to improve the radial Zn homogeneity. CdZnTe boule has been grown by seeded vertical Bridgman furnace with two zones of heater and cooler. Ultraviolet/visible spectroscopic measurements of Zn composition over the length of the boule indicate that the radial distribution of Zn composition is very homogeneous in the body region of the boule, where the radial variation of Zn composition is ±0.0005. ? 1995 The Metallurgical of Society of AIME.
Keywords
Cadmium alloys; Composition; Computer simulation; Microanalysis; Semiconducting cadmium compounds; Substrates; Ultraviolet spectroscopy; Cadmium zinc telluride boule; Electron probe microanalysis; Vertical Bridgman techniques; Zinc homogeneity; Semiconducting zinc compounds; Cadmium alloys; Composition; Computer simulation; Microanalysis; Semiconducting cadmium compounds; Substrates; Ultraviolet spectroscopy; Cadmium zinc telluride boule; Electron probe microanalysis; Vertical Bridgman techniques; Zinc homogeneity; Semiconducting zinc compounds; CdZnTe; modified Bridgman technique; numerical simulation; Zn homogeneity
ISSN
0361-5235
URI
https://pubs.kist.re.kr/handle/201004/145400
DOI
10.1007/BF02653053
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KIST Article > Others
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