고분해능 투과전자현미경을 이용한 (001) CdTe/(001) GaAs 박막의 결함

Authors
서상희권명석이정용송원준
Issue Date
1994-01
Publisher
한국물리학회
Citation
응용물리, v.7, pp.266 - 266
Keywords
TEM; (100)CdTe/(100)GaAs; 결함
ISSN
1013-7009
URI
https://pubs.kist.re.kr/handle/201004/145747
Appears in Collections:
KIST Article > Others
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