DSpace at KISTKIST Publication2008

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dc.contributor.authorAhn, Jae Pyoung-
dc.contributor.authorKim Kyou Hyun-
dc.contributor.authorYoon Sang Won-
dc.date.accessioned2024-02-21T05:14:09Z-
dc.date.available2024-02-21T05:14:09Z-
dc.date.issued2008-10-
dc.identifier.issn--
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/149007-
dc.subjectFIB-
dc.subjectTEM-
dc.subjectTEM sampling-
dc.subjectNano patterning-
dc.subjectContamination-
dc.titleRecent FIB applications for TEM works of thin films-
dc.typeBook-
dc.citation.startPage281-
dc.citation.endPage297-
dc.relation.isPartOfSeriesTransworld Research Network-
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KIST Publication > 2008
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