DSpace at KISTKIST Publication

20251

Browse

Discover

| Subscribe to this collection to receive daily e-mail notification of new additions 

Issue DateTitleAuthor(s)
2025-09The Investigation of Effective Thermal Oxidation to SiC MOSFET Gate Oxide Quality ImprovementYoungbin Im; Inkyu Kim; Jiyeong Yoon; Jingu Lee; Gihoon Park; Jesung Lim; Junewoo Son; Jungho Lee; Yun Jung Jang; Changbeom Jeong
1

BROWSE