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An automated glitch-detection/restoration method of atomic force microscope images

Title
An automated glitch-detection/restoration method of atomic force microscope images
Authors
Chankyeong Hyon; Sangwook Oh; Hyungkwon Kim; Sanghoon Sull; Sungwoo Hwang; Doyeol Ahn; 박용주; Eunkyu Kim
Keywords
AFM
Issue Date
2002-09
Publisher
Review of Scientific Instruments
Citation
VOL 73, NO 9, 3245-3250
URI
https://pubs.kist.re.kr/handle/201004/15467
ISSN
0034-6748
Appears in Collections:
KIST Publication > Article
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