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DC biased capacitance method for measuring thin film magnetostriction and ΔEeffect

Title
DC biased capacitance method for measuring thin film magnetostriction and ΔEeffect
Authors
이영호; Y.D. Shin; P.H. Herr; K.H. Lee; 김희중; 한석희; 강일구; J.R. Rhee
Keywords
thin film
Issue Date
1994-11
Publisher
IEEE Transactions on Magnetics
Citation
VOL 30, NO 6, 4566-4568
URI
https://pubs.kist.re.kr/handle/201004/21076
ISSN
0018-9464
Appears in Collections:
KIST Publication > Article
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