Atomic force microscopy study and absorption properties of epitaxial AlxGa1-xN

Title
Atomic force microscopy study and absorption properties of epitaxial AlxGa1-xN
Authors
김제원최인훈박영균김용태O. AmbacherM. Stutzmann
Keywords
AFM; AlGaN; Absorptiom Properties
Issue Date
1999-04
Publisher
한국물리학회회보 : 제75회 총회프로그램, 논문초록집
Citation
VOL 17, NO 1, 218-218
URI
https://pubs.kist.re.kr/handle/201004/24007
Appears in Collections:
KIST Publication > Conference Paper
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE