New model for low-frequency noise in poly-Si resistors

Title
New model for low-frequency noise in poly-Si resistors
Authors
이정일한일기장수경김은규이명복
Keywords
low-frequency noise; poly-Si resistors; thermal activation; tunneling; random walk of electrons; thermionic emission
Issue Date
2005-01
Publisher
Key Engineering Materials
Citation
VOL 277-279, 1054-1059
URI
https://pubs.kist.re.kr/handle/201004/26122
ISSN
1013-9826
Appears in Collections:
KIST Publication > Article
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