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Gate-bias dependence of low-frequency noise in poly-Si thin-film transistors

Title: Gate-bias dependence of low-frequency noise in poly-Si thin-film transistors

Authors: 한일기; 이정일; 이명복; 장수경; 김은규

Keywords: polycrystalline-silicon; thin-film transistors; low-frequency noise; number fluctuation; thermal activation; tunneling; barrier height

Issue Date: 2004-12

Publisher: Journal of the Korean Physical Society

Citation: VOL 45, S949-S954

URI: https://pubs.kist.re.kr/handle/201004/28006

ISSN: 0374-4884

Appears in Collections:: KIST Publication > Article

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