A New Method for Lateral Force Calibration in Atomic Force Microscope
- A New Method for Lateral Force Calibration in Atomic Force Microscope
- 김홍준; 왕비; 윤의성; 공호성
- Atomic Force Microscopy; Lateral Force; Calibration; Contact factor
- Issue Date
- 한국윤활학회지; Journal of the KSTLE (Journal of the Korean Society of Tribologists and Lubrication Engineers)
- VOL 21, NO 5, 216-222
- Appears in Collections:
- KIST Publication > Article
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