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Characterization of sputter-deposited SrZrO3:Cr films on Si substrates for commercial memory device applications

Title
Characterization of sputter-deposited SrZrO3:Cr films on Si substrates for commercial memory device applications
Authors
박재완; 박종완; 이전국
Keywords
resistive switching; SrZrO3:Cr; polycrystalline; Silicon substrate
Issue Date
2006-12
Publisher
Journal of the Korean Physical Society
Citation
VOL 49, S447-S451
URI
https://pubs.kist.re.kr/handle/201004/29487
ISSN
0374-4884
Appears in Collections:
KIST Publication > Article
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