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Atomic arrangement variations of [0001]-tilt grain boundaries in ZnO thin films grown on p-Si substrates due to thermal treatment

Title: Atomic arrangement variations of [0001]-tilt grain boundaries in ZnO thin films grown on p-Si substrates due to thermal treatment

Authors: J.W. Shin; J.Y.Lee; 노영수; J.H. Jung; 김태환; 최원국

Keywords: grain boundary; p-Si; ZnO; TEM

Issue Date: 2007-07

Publisher: Applied physics letters

Citation: VOL 90, 181907-1-181907-3

URI: https://pubs.kist.re.kr/handle/201004/31647

ISSN: 0003-6951

Appears in Collections:: KIST Publication > Article

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