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Interface structure and strain relaxation in BaTiO3 thin films grown on GdScO3 and DyScO3 substrates with buried coherent SrRuO3 layer

Title: Interface structure and strain relaxation in BaTiO3 thin films grown on GdScO3 and DyScO3 substrates with buried coherent SrRuO3 layer

Authors: Y. B. Chen; H. P. Sun; M. B. Katz; X. Q. Pan; 최경진; H. W. Jang; C. B. Eom

Issue Date: 2007-12

Publisher: Applied physics letters

Citation: VOL 91, NO 25, 252906-1-252906-3

URI: https://pubs.kist.re.kr/handle/201004/33276

ISSN: 0003-6951

Appears in Collections:: KIST Publication > Article

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