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Annealing Effects on the Microstructural Properties of the ZnO Thin Films Grown on p-InP (100) Substrates

Title: Annealing Effects on the Microstructural Properties of the ZnO Thin Films Grown on p-InP (100) Substrates

Authors: J. M. Yuk; D. I. Son; T. W. Kim; J. Y. Kim; 최원국

Keywords: ZnO Thin Films; p-InP Substrates; rapid thermal treatment; Microstructural Properties; Amorphous layer

Issue Date: 2008-07

Publisher: Journal of the Korean Physical Society

Citation: VOL 53, NO 1, 357-360

URI: https://pubs.kist.re.kr/handle/201004/34825

ISSN: 0374-4884

Appears in Collections:: KIST Publication > Article

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