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dc.contributor.author이항원-
dc.contributor.author박정현-
dc.contributor.author남산-
dc.contributor.author김동완-
dc.contributor.author박재관-
dc.date.accessioned2015-12-02T15:16:51Z-
dc.date.available2015-12-02T15:16:51Z-
dc.date.issued201001-
dc.identifier.citationVOL 45, NO 1, 21-24-
dc.identifier.issn0025-5408-
dc.identifier.other31408-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/36599-
dc.description.abstractWe demonstrate the correlation between sintering behavior and microstructural observations in lowtemperature sintered, LaNbO4 microwave ceramics. Small CuO additions to LaNbO4 significantly lowered the sintering temperature from 1250 to 950 8C. To elucidate the sintering mechanism, the internal microstructure of the sample manipulated by a focused ion beam (FIB) was investigated using transmission electron microscopy (TEM) and energy-dispersive spectroscopy (EDS). LaNbO4 with 3 wt% CuO sintered at 950 8C for 2 h possessed the following excellent microwave dielectric properties: a quality factor (Qxf) of 49,000 GHz, relative dielectric constant (er) of 19.5, and temperature coefficient of resonant frequency (tf) of 1 ppm/8C. The ferroelastic phase transformation was also investigated using in situ X-ray diffraction (XRD) to explain the variation of tf in low-temperature sintered LaNbO4 as a function of CuO content.-
dc.publisherMaterials research bulletin-
dc.subjectceramics-
dc.subjectmicrowave-
dc.subjectDielectric properties-
dc.subjectlanthanium niobate-
dc.subjectmicrostructure-
dc.subjectoxides-
dc.subjectElectron microscopy-
dc.subject*2009년 개인평가에 반영완료-
dc.titleLow-temperature sintering of temperature-stable LaNbO4 microwave dielectric ceramics-
dc.typeArticle-
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