Full metadata record

DC FieldValueLanguage
dc.contributor.author이상수-
dc.contributor.author박종혁-
dc.contributor.author김영진-
dc.contributor.authorKeun-Young Shin-
dc.contributor.authorFelipe V. Antolinez-
dc.contributor.authorJeong Sook Ha-
dc.date.accessioned2021-06-09T04:18:21Z-
dc.date.available2021-06-09T04:18:21Z-
dc.date.issued2016-10-
dc.identifier.citationVOL 2, NO 10-1600233-8-
dc.identifier.issn2199-160X-
dc.identifier.other48932-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/66094-
dc.description.abstractResistive random access memory (ReRAM) has a great potential to be the next-generation non-volatile memory device. However, the random nucleation and growth of conductive filaments (CFs) in ReRAM causes the low reliability in switching behaviors, leading to difficulties in its practical application. This study demonstrates that manipulating electric fields in ReRAM via a structured electrode can provide the controllable formation of CFs. Ag pyramids that have a high-quality tip prepared via the template-stripping method generate highly enhanced electric fields at the tip. Because the tip-enhanced electric fields can facilitate the ionization of Ag atoms and their migration along the electric fields, the nucleation and growth of CFs occurs predominantly at the tip. The CFs in ReRAM are directly observed using electron microscopy and it is confirmed that the CFs are formed only at the tip. The resulting ReRAM exhibits low and reliable SET/RESET voltages (0.48 V ± 0.02 V and 0.15 V ± 0.06 V, respectively). Moreover, its endurance and retention time are highly improved, compared to those devices that are based on conventional geometry. Thus, this approach can encourage creating high-performance ReRAM.-
dc.publisherAdvanced electronic materials-
dc.subjectresistive memory-
dc.subjecttip-enhanced electric field-
dc.subjectnanofilament-
dc.subjectreliable switching-
dc.subjectlow operation voltage-
dc.titleControllable Formation of Nanofilaments in Resistive Memories via Tip-Enhanced Electric Fields-
dc.typeArticle-
dc.relation.page1600233-11600233-8-
Appears in Collections:
KIST Publication > Article
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE