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dc.contributor.author채근화-
dc.contributor.authorJitendra Pal Singh-
dc.date.accessioned2021-06-09T04:23:04Z-
dc.date.available2021-06-09T04:23:04Z-
dc.date.issued2019-05-
dc.identifier.citationVOL 216, NO 9-1800997-7-
dc.identifier.issn1862-6300-
dc.identifier.other53562-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/70151-
dc.publisherPhysica Status Solidi. A, Applications and Materials Science-
dc.subjectzinc ferrite films-
dc.subjectradio frequency sputtering-
dc.subjectnear-edge X-ray absorption-
dc.subjectoptical band-gap-
dc.subjectUV-Vis Spectroscopy-
dc.titleUV-Vis spectroscopic and NEXAFS measurements of polycrystalline zinc ferrite thin film-
dc.typeArticle-
dc.relation.page1800997-11800997-7-
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