Channel thickness-dependent mobility degradation in planar junctionless
- Channel thickness-dependent mobility degradation in planar junctionless
- junctionless transistors; bulk conduction; threshold voltage; maximum depletion width; mobility degradation
- Issue Date
- Japanese Journal of Applied Physics, Part 1- Regular Papers
- VOL 59, NO 014001-014001-4
- Appears in Collections:
- KIST Publication > Article
- Files in This Item:
There are no files associated with this item.
- RIS (EndNote)
- XLS (Excel)
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.