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극성 용매의 웨팅이 가능한 나노 광학 센서 및 이를 활용한 극성 용매 분석 방법

Author

유의상; 유용상; 송현석; 정철현

Assignee

한국과학기술연구원

Regitration Date

2021-03-24

Registration No.

10-2233627

Application Date

2019-07-17

Application No.

10-2019-0086228

Country

KO

URI

https://pubs.kist.re.kr/handle/201004/76140

Appears in Collections:

KIST Patent > Others

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