Exchange-stiffness measurement scheme based on domain-wall chirality transition

Abstract

Thisstudywassupporte dbytheSamsungScienceand Technology Foundation (No. SSTF-BA1802-07), the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT (MSIT) (Nos. 2015M3D1A1070465 and 2020R1A5A1016518), and Samsung Electronics Co., Ltd. D.H.K. was supported by the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT (No. 2022R1A2C2004493), the POSCO Science Fellowship of the POSCO TJ Park Foundation, the National Research Council of Science and Technology (NST) grant funded by the Ministry of Science and ICT (No. 2N45290), and the Korea Institute of Science and Technology (KIST) Institutional Program (Nos. 2E31032 and 2E31541).