Backside Illuminated, Three Dimensional Stacked Single Photon Avalanche Diode Technology in 45nm CMOS

Authors
Lee, Myung Jae
Issue Date
2018-09-25
Publisher
TGIST
Citation
Technical Group on Information Sensing Technologies
URI
https://pubs.kist.re.kr/handle/201004/79065
Appears in Collections:
KIST Conference Paper > 2018
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