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Film thickness effect on the properties of interconnection between YBCO and Si for superconductor integration.

Title: Film thickness effect on the properties of interconnection between YBCO and Si for superconductor integration.

Authors: Y. S. Jeong; J. H. Park; D. S. Eun; S. Y. Lee; 김창훈; 한택상; J. Y. Kim; I.-S. Yang

Keywords: Interconnection

Issue Date: 1997-12

Publisher: Applied Superconductivity

Citation: VOL 5, NO 7-12, 353-356

URI: https://pubs.kist.re.kr/handle/201004/7929

ISSN: 09641807

Appears in Collections:: KIST Publication > Article

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