DSpace at KIST: Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy

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DSpace at KISTKIST Conference Paper 2018

Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy

Other Titles: 테라헤르츠 분광학에 의한 유기발광 다이오드의 열화 특성 분석

Authors: Jeong Young Kon; Soo Jong Park; Lee, Sang-Hun; Byeong-Kwon Ju; Jhon, Young Min; MINAH SEO

Issue Date: 2018-07

Publisher: OSK

Citation: OECC 2018 The 23rd optoElectronics and Communications Conference

Abstract: We investigated degradation of organic light emitting diodes (OLED) by terahertz (THz) time-domain spectroscopy. Decreased reflectance at 0.84 THz was observed inferred from the electric degradation of OLED.

Keywords: Teraheryz spectroscopy; Organic light emitting diodes; Degradation

ISSN: 2166-8884

URI: https://pubs.kist.re.kr/handle/201004/79405

Appears in Collections:: KIST Conference Paper > 2018

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