An Efficient Simulation Algorithm for Analysis of Moire Patterns in Display Systems

Abstract

In this paper, we propose a precise and fast computational method for the simulation and analysis of moir？ patterns including a complex, large scale of films and a reflecting surface under illumination of an external ambient light source. This algorithm is based on convolution with superposition of the intensity profile which is transmitted from the optical layers and the point spread function. The computation time is shown to be much faster than that of the conventional ray-tracing algorithm. It was also considered of an optically equivalent system with no reflection surface layer in order to handle a non-sequential system containing a reflecting surface.