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Effect of Rapid Thermal Annealing on Electrical Conductivity of ZnO Single Nanowire Device manufactured by FIB

Authors

Ahn, Jae Pyoung

Issue Date

2008-11

Publisher

자기조립학회

Citation

Self Assembly Processes and Materials : Applicaitons in future memory

URI

https://pubs.kist.re.kr/handle/201004/80989

Appears in Collections:

KIST Conference Paper > 2008

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