Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.date.accessioned | 2024-01-12T08:16:30Z | - |
| dc.date.available | 2024-01-12T08:16:30Z | - |
| dc.date.created | 2022-01-14 | - |
| dc.date.issued | 2005-08-01 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/82008 | - |
| dc.title | Complex permittivity of thin PCB substrate measured by open-ended coaxial probe | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | KEES, pp.1097 - 1100 | - |
| dc.citation.title | KEES | - |
| dc.citation.startPage | 1097 | - |
| dc.citation.endPage | 1100 | - |
| dc.relation.isPartOf | Proc. ISAP - 직접입력 | - |
- Appears in Collections:
- KIST Conference Paper > 2005
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