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Effects of electron deep traps on generation lifetime in denuded zone n-type(III) Cz-Si wafer.

Title
Effects of electron deep traps on generation lifetime in denuded zone n-type(III) Cz-Si wafer.
Authors
김은규; 김현수; 민석기
Keywords
electron deep trap; generation lifetime; Cz-Si
Issue Date
1991-05
Publisher
Journal of applied physics
Citation
v. 69, no. 10, 6979-6981
URI
https://pubs.kist.re.kr/handle/201004/8494
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KIST Publication > Article
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